Optical Profilometer Training

8.2: The Stitch Analysis Tab

Screenshot of the Stitch Analysis Tab
Stitch Analysis Tab
Mx™ Software Screenshot

Stitch Analysis controls are used to specify how sites are aligned and how overlap areas are processed.

Stitch Analysis- Stitch Parameters

Type - Selects how sites are aligned. Options are Adjust XY, Cartesian, or Overlay. Adjust XY matches and aligns sites in x and y axes. Cartesian matches and aligns sites in x, y, z, pitch, and roll (5 axes). Overlay aligns sites based on stage coordinates.

Overlap Merge - Selects what happens in overlap regions. Options are Blend, Average, or No Merge. Blend does an interpolation (fitting) of the sites. Average averages the data in the overlap regions. No Merge does not merge overlapping areas.

Sample Mode - Selects how sites are sub sampled. This is typically used to increase throughput when stitch sequences are large (more than 100 sites). Options are None, Bin, or Skip. None means no sub sampling is performed. Bin uses a convolution of camera data and then downscales and averages data. Skip reduces the number of data points by using row and column data as determined by the Sample Factor control.

Sample Factor - Determines the functionality of the Sample Mode control. When Sample Mode is Bin, it is how many pixels get binned together. When Sample Mode is Skip, it determines the number of rows and columns of pixels to skip (or not use).

Enable Global Correction - When this check box is selected, a Cartesian algorithm is also applied after adjusting X,Y position using the Adjust XY algorithm. Only available when Type is Adjust XY.

Preprocessing Sequence - Opens a processing sequence window. This is used to specify data processing operations on the raw stitch data before it is all stitched together. See Data Processing for details on using this feature. For example, if the combined stitch area results in multiple tilted planes with nothing connecting between sites, use the remove form function in the Sequence tool.

Stitch Analysis- Advanced

Search Window - Specifies how much searching is attempted when aligning sites to each other. Too large of a search area increases processing time. Too small of an area may provide insufficient matching. The Automatic setting is determined internally and displayed. To override the Automatic setting, select the Manual radio button and enter a dimension.

Lateral Resolution - This attribute shows the lateral resolution of the current instrument configuration.

Search Window - This attribute shows the size of the search window in pixels.